Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Researchers at the University of Jyväskylä (Finland), in cooperation with national and international research groups, have ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

A recent international research project has used advanced microscopy techniques and computational modeling to discover why ...

Neutral helium microscopy and atom optics constitute an innovative imaging paradigm that exploits low-energy, charge-neutral helium atoms to non-destructively investigate surface properties at the ...

Microscopes have long been scientists’ eyes into the unseen, revealing everything from bustling cells to viruses and nanoscale structures. However, even the most powerful optical microscopes have been ...

Understanding failure modes, mechanisms, and root causes is critical in the manufacturing of semiconductors and electronic devices. Identifying the underlying cause of a failure not only helps prevent ...

Researchers have used advanced microscopy and computational modeling to show how herpesvirus infection affects host-cell nucleus structure.

In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...