The construction of compact semiconductors with reduced thickness and size is desirable for their application in microelectronic devices and transistors. However, measuring the parameters such as ...
A new technical paper titled “Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry” was published by researchers at IMEC and KU Leuven. ...
Chris Jeynes works for the University of Surrey Ion Beam Centre which receives funding from the Engineering and Physical Sciences Research Council and others for ion implantation and ion beam analysis ...
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